Defect generation in nano-twinned, nano-grained and single crystal Cu systems caused by wear: A molecular dynamics study
Yue, L (Yue, L.); Zhang, H (Zhang, H.); Li, DY (Li, D. Y.)
SCRIPTA MATERIALIA, 63 (11): 1116-1119 NOV 2010
Dynamic electrical contacts may lose their conductivity due to wear or oscillation-induced defects (primarily dislocations). Nano-twinned Cu appears to be a promising candidate for dynamic contacts. Molecular dynamics simulations have been conducted to study defect generation in nano-twinned Cu during wear, in comparison with nano-grained Cu and single crystal Cu. Defect generation in the former was lower during bidirectional sliding wear. The Bauschinger effect was noticed during bidirectional sliding, demonstrated by a decrease in the density of residual defects. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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